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SIGLENT Technologies Attended EMC 2016 in Ottawa!
  • Published:2016-08-02
  • Views:2224

Ottawa, Canada- July 25-29, 2016. The IEEE EMC Symposium was a grand event, which provided knowledge and tools that helped engineers address electromagnetic environmental effects and electromagnetic compatibility. 

Figure 1  Siglent products showcased during EMC

This was the first time that Siglent had attended the conference. Some of our latest products, technologies and services, including the new SSA3000X family of spectrum analyzers, were displayed on the conference, which also attracted lots of visitors to come by. Siglent staff introduced core features and characteristics to visitors and had delight conversations with them. 

Figure 2  Siglent Staff Speaking with Visitors

Siglent Technologies would like to thank all of you for your visit to our booth. We will continue to develop and manufacture products with the highest value in electronic test & measurement instrumentation for you! 

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